Innovative CMOS and Amorphous Silicon Flat Panel X-Ray Imaging Technologies at RSNA 2015

The new Complementary Metal-Oxide Semiconductor (CMOS) detector is intended for use in fluoroscopy systems such as the mobile C-arm, while the Amorphous Silicon (a-Si) flat panel X-ray detector is intended for use in Cone Beam Computed Tomography (CBCT).

PerkinElmer (Waltham, MA, USA) developed the X-Ray detectors, both of which will begin shipping in 2016.

The XRD4343RF system is a 43 cm x 43 cm detector with frame rates up to 50 fps, and a direct-deposited CsI scintillator. The system was designed to enhance the performance of CBCT systems, and provide improved X-ray images for a variety of applications. The Dexela 2321 is a 23 cm x 21 cm real-time X-Ray detector, with a CsI scintillator, and very low dose Detective Quantum Efficiency (DQE). The Dexela 2321 uses advanced low-noise CMOS image sensors that provide high speed real-time imaging for surgical applications.

PerkinElmer will also present its family of lightweight XRpad cassette-sized flat panel detectors. The XRpad 4336 is a wireless portable digital radiography detector. The XRpad 4343 F is a wired detector intended for digital radiography. The XRpad2 3025 is still in development, is designed for digital radiography, and has an imaging area of 30 cm x 25 cm.

Brian Giambattista, president, Medical Imaging, PerkinElmer, said, "We are pleased to highlight our comprehensive portfolio of advanced X-ray imaging technologies for medical equipment manufacturers and healthcare providers at this international forum for radiology professionals. PerkinElmer offers industry leading solutions that our customers can easily integrate into their systems for superior image quality, reduced radiation dose and controlled costs."

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